YIELD STABILITY AND ADAPTABILITY OF COMMON BEAN LINES DEVELOPED BY EMBRAPA

Authors

  • Joaquim Geraldo Cáprio da Costa EMBRAPA
  • Carlos Agustin Rava EMBRAPA
  • Francisco José Pfeilsticker Zimmermann Universidad de La Sabana
  • Leonardo Cunha Melo

Keywords:

Phaseolus vulgaris, disease resistance, plant breeding, grain yield

Abstract

The objective of this research was to evaluate the common bean lines developed by the Embrapa Rice and Beans Research Center, concerning stability, adaptability, resistance to diseases and other desirable agronomic characteristics. The lines were divided in two experimental groups, one including 216 black grain lines, and the other with 56 color grain lines (Carioca and Mulatinho), both groups with four check varieties. The experimental design was the Federer's augmented blocks. The environmental indexes (Ij), the regression coefficients (bi), and their deviation variances (s2di) were obtained using the Eberhart & Russell's (1966) method. Among the 56 color grain lines, 40 showed stable performance, and among the 216 black grain lines, 49 were considered stable. The mean grain yield for the CNFP10080 line, which belongs to the black grain group, was significantly higher (p < 0.05) than the Diamante Negro check. The CNFP10099 and CNFP10123 black grain lines showed specific adaptability to unfavorable environments, that is, they presented bi values significantly lower (p < 0.05) than the unit. Among the genotypes with stable behavior and good adaptability, the CNFC10276 (color grain group) and CNFP10207 (black grain group) lines showed good plant architecture; CNFM10258 and CNFC10283 (both from color grain group), and also CNFP10229 (black grain group) showed suitable architecture and resistance to rust; CNFM10249, CNFM10251, and CNFM10253 (all with colored seed), and also CNFP10212 (black seed) presented joint resistance to angular leaf spot and rust.


KEY-WORDS: Phaseolus vulgaris; disease resistance; plant breeding; grain yield.

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Author Biographies

Joaquim Geraldo Cáprio da Costa, EMBRAPA

Embrapa Arroz e Feijão, Caixa Postal 179, CEP 75375-000 Santo Antônio de Goiás, GO. Bolsista do CNPq.

Carlos Agustin Rava, EMBRAPA

In memorium

Francisco José Pfeilsticker Zimmermann, Universidad de La Sabana

Universidad de La Sabana, Facultad de Ingeníeria, Area de Matematicas Aplicadas. Chía, Colômbia.

Leonardo Cunha Melo

Embrapa Arroz e Feijão, Caixa Postal 179, CEP 75375-000 Santo Antônio de Goiás, GO. Bolsista do CNPq.

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Published

2008-07-01

How to Cite

COSTA, J. G. C. da; RAVA, C. A.; ZIMMERMANN, F. J. P.; MELO, L. C. YIELD STABILITY AND ADAPTABILITY OF COMMON BEAN LINES DEVELOPED BY EMBRAPA. Pesquisa Agropecuária Tropical [Agricultural Research in the Tropics], Goiânia, v. 38, n. 2, p. 141–145, 2008. Disponível em: https://revistas.ufg.br/pat/article/view/4169. Acesso em: 30 jun. 2024.

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Section

Research Article